Method and apparatus for automated docking of a test head to a device handler
AssigneeinTEST Corporation
InventorsDaniel J. Graham, Alyn R. Holt, Robert E. Matthiessen, I. Marvin Weilerstein, Christopher L. West
Life of this patent
Estimating the term…
Abstract
A positioner facilitates docking and undocking of an electronic test head with a device handler. The positioner provides for rotation of the test head about a first axis. The positioner includes a linkage arm structure for moving the test head along a second axis orthogonal to the first axis. Using motors, sensors and a processor, the linkage arm structure accurately docks the electronic test head with the device handler.
Claims15
A positioner for docking an electronic test head with a device handler, comprising:
- head rotation means for rotating said electronic test head about a first axis;
- motion means for moving said electronic test head along a second axis orthogonal to said first axis;
- sensor means for determining respective distances between a plurality of locations on a surface of said electronic test head and a respective plurality of locations on a surface of said device handler;
- and
- means for
- a) selectively signalling said head rotation memos to rotate said electronic test head about said first axis;
- and
- b) selectively signalling said motion means to move said electronic test head along said second axis;
- responsive to said respective distances determined by said sensor means in order to dock said electronic test head with said device handler.
A method for docking an electronic test head with a device handler, comprising the steps of:
- rotating said electronic test head about a first axis;
- moving said electronic test head along a second axis orthogonal to said first axis;
- determining respective distances between a plurality of locations on a surface of said electronic test head and a respective plurality of locations on a surface of said device handler;
- and
- responsive to said respective distances determined between said plurality of locations on said surface of said electronic test head and said respective plurality of locations on said surface of said device handler;
- a) selectively signaling said head rotation means to rotate said electronic test head about said first axis;
- and
- b) selectively signaling said vertical motion means to move said electronic test head along said second axis;
- in order to dock said electronic test head with said device handler.
Dependencies are inferred from the claim text.