Apparatus and method for an object measurement system
AssigneeMetronics, Inc.
InventorsGregg Granville, J. Peter Glasson
Life of this patent
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AssigneeMetronics, Inc.
InventorsGregg Granville, J. Peter Glasson
Estimating the term…
An apparatus and method for an object measurement system is described which may be utilized in the inspection and measurement of various objects so as to obtain information regarding their features, dimensional measurements and tolerances. Various devices and methods for data point location and data entry are described which may be utilized in either manual and/or automatic modes of system operation. Input data is monitored so as to prevent erroneous data from being utilized and indication means are provided to notify a user or operator when erroneous data has been entered into the system. The present invention also provides a means by which the user or operator may enter point location data without having to preselect a feature type which is to be inspected and/or measured. The present invention also provides an apparatus and method for processing the point location data so as to determine the feature type therefrom within pre-specified error limits and without user pre-selection and for resolving ambiguities which may arise in the course of such processing. The user or operator may also override system operation if the feature type does not match the user's or operator's expected result. The system provides extensive user interaction capabilities and methods.
An object inspection system comprising:
An inspection system comprising:
Dependencies are inferred from the claim text.