Apparatus for detecting relative movement
AssigneeMicroE, Inc.
InventorDonald K. Mitchell
Life of this patent
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AssigneeMicroE, Inc.
InventorDonald K. Mitchell
Estimating the term…
The apparatus disclosed herein employs a grating or scale which concentrates light at a preselected wavelength into the positive and negative first orders while minimizing the zeroth order. The scale is illuminated with monochromatic light of the selected wavelength and a poly-phase periodic detector has its sensing plane spaced from the scale a distance less than ##EQU1## where W is the width of the illuminated region of the scale. The period of the poly-phase detector is equal to P/2 so that each detector element or phase responds principally to interference between the positive and negative first orders without requiring magnification or redirection of the diffracted light. Preferably, the distance of the sensing plane from the scale is greater than ##EQU2## so that the detector response does not include substantial components from diffraction orders higher than the first.
Apparatus for detecting relative movement comprising a diffraction scale relatively movable with respect to a source of light and having a period P and a characteristic which concentrates light diffracted at a preselected wavelength .lambda. into the positive and negative first orders;
Apparatus for detecting relative movement comprising;
Apparatus for detecting relative movement comprising:
Apparatus for detecting relative movement comprising:
A method for detecting relative movement of an object comprising
Apparatus for detecting relative movement of an object with respect to a beam of light substantially of wavelength .lambda. including:
Dependencies are inferred from the claim text.