Multi-Parameter eddy current measuring system with parameter compensation technical field
AssigneeKaman Instrumentation Corporation
InventorTim Danielson
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AssigneeKaman Instrumentation Corporation
InventorTim Danielson
Estimating the term…
This invention uses a single eddy current coil to measure multiple parameters of conductive target simultaneously using a single fixed frequency. For example, the system consisting of the sensor coil, connecting cable, and signal conditioning electronics, can measure the thickness of a target and the distance of the target from the coil. Alternatively, it could simultaneously measure the distance of the target to the coil, i.e. lift-off, and one of the electrical properties of the target, such as the resistivity. The present system is useful in material characterization of targets where the lift-off information can be used to correct for any lift-off induced error in the apparent resistivity. In general, it can determine any pair of two characteristics of the target/sensor relationship simultaneously. This invention provides significant improvement in accuracy and flexibility of eddy current sensors and can be manufactured at a low cost due to the use of a single coil and a single fixed frequency in the signal conditioning electronics. An alternative sensor configuration utilizing two sensors differentially to produce a cladding insensitive--displacement measurement is also contemplated by the present invention.
A method of measuring physical parameters characteristic of a workpiece whose workpiece parameters include material, thickness, temperature, permeability and conductivity, said method comprising the steps of:
A system for measuring physical parameters characteristic of a workpiece whose workpiece parameters include material, thickness, temperature, permeability and conductivity, said system comprising:
Dependencies are inferred from the claim text.