Burst EDO memory device
AssigneeMicron Technology, Inc.
InventorsPaul S. Zagar, Brett L. Williams, Troy A. Manning
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsPaul S. Zagar, Brett L. Williams, Troy A. Manning
Estimating the term…
An integrated circuit memory device is designed for high speed data access and for compatibility with existing memory systems. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. Transitions of the Read/Write control line during a burst access will terminate the burst access, reset the burst length counter and initialize the device for another burst access. The device is compatible with existing Extended Data Out DRAM device pinouts, Fast Page Mode and Extended Data Out Single In-Line Memory Module pinouts, and other memory circuit designs.
A memory device having a plurality of memory elements, each of the elements having an associated address, the memory device further comprising:
A memory device having a plurality of memory elements, each of the elements having an associated address, the memory device further comprising:
A memory device having an address latch node for receiving an address strobe signal, an address latch for receiving at least a portion of a first memory address and an array of memory elements, the memory device comprising:
A memory device having an address strobe signal node for receiving an address strobe signal and an array of memory elements, the memory device comprising:
A memory device having a plurality of data nodes for receiving and driving a plurality of data signals, an array of memory elements, and a plurality of address nodes for receiving a row and a column address, the memory device comprising:
A memory device having an array of memory elements, in which a row address has been selected, comprising:
A memory device having external nodes for receiving a plurality of signals consisting essentially of a column address strobe signal a cycle of which defines an access cycle period, a row address strobe signal, a write enable signal, an output enable signal, address signals, data signals and power supply signals, the memory device comprising:
A method of reading data from a memory device having an address latch, an address counter, an address strobe node for receiving a column address strobe, an output data driver and an array of memory elements, the method comprising:
A method of terminating a burst access of a memory device having an array of memory elements, an address generation circuit for providing a plurality of addresses for accessing the array, and a read and write cycle input node for receiving a write enable signal, the method comprising:
A Single In Line Memory Module comprising:
A Memory Module comprising:
A computer system which is capable of rapid storage and retrieval of data, comprising:
A computer system comprising:
A computer system which is capable of rapid storage and retrieval of data, comprising:
A burst access memory device comprising:
Dependencies are inferred from the claim text.