Apparatus and method for measuring the phase and magnitude of microwave signals
AssigneeWiltron Company
InventorsDonald A. Bradley, Martin I. Grace, Douglas R. Thornton, David P. Finch
Life of this patent
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AssigneeWiltron Company
InventorsDonald A. Bradley, Martin I. Grace, Douglas R. Thornton, David P. Finch
Estimating the term…
A measurement system is provided which comprises: source circuit for receiving feedback signals and for providing respective signals at respective discrete frequencies in a prescribed microwave frequency range, wherein the respective provided signals at respective discrete frequencies are substantially phase locked to at least one downconverted signal in response to the feedback signals; downconverting circuit for linearly downconverting the respective provided signals and for providing the at least one respective downconverted signal; and phase detector circuit for receiving the at least one respective downconverted signal and for providing the feedback signals.
A measurement system comprising:
A measurement system comprising:
A system for measuring microwave frequency signals incident upon a device under test (DUT), comprising:
A system for measuring microwave frequency signals incident upon a device under test (DUT), comprising:
A system for measuring microwave frequency signals incident upon a device under test (DUT) comprising:
A method for measuring microwave frequency signals incident upon a device under test (DUT) comprising the steps of:
A method of operating a network analyzer so as to avoid the generation of spurious intermediate frequency signals when measuring microwave frequency signals incident upon a device under test (DUT) comprising the steps of:
A method of operating a network analyzer as to avoid the generation of spurious intermediate frequency signals when measuring microwave frequency signals incident upon a device under test (DUT) comprising the steps of:
Dependencies are inferred from the claim text.