System and method for stable analysis of sampled transients arbitrarily aligned with their sample points
AssigneeLiberty Technologies, Inc.
InventorMartin J. Dowling
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AssigneeLiberty Technologies, Inc.
InventorMartin J. Dowling
Estimating the term…
A method of stably identifying and characterizing a transient contained in a sampled set of data, the data representing a physical event, where alignment of the sample points with the transient is typically arbitrary. The method includes the step of analyzing the first data set using a predefined mathematical operator to produce a second data set, detecting and isolating the discrete data pattern in the second data set, determining a location of the detected and isolated data pattern in the second data set, measuring a difference between the location of the detected and isolated data pattern and a predetermined location of the predefined mathematical operator, adjusting preselected parameters of the mathematical operator in accordance with the measured location difference such that the adjusted mathematical operator is aligned with the detected and isolated data pattern, and reanalyzing the first data set using the aligned mathematical operator.
A method of stably identifying and characterizing a transient data pattern contained in an electrical signal representing a physical event, a sampled representation of the electrical signal comprising a first data set having a plurality of sample points, wherein alignment of the sample points with the transient data pattern is arbitrary, the method comprising the steps of:
A system for analyzing isolated data patterns in a signal comprising:
A system for analyzing isolated data patterns in a signal comprising:
Dependencies are inferred from the claim text.