Adjustable microscope base
AssigneeWilson Greatbatch Ltd.
InventorMark L. Mika
Life of this patent
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Abstract
An ergonomic adjustable microscope base comprising a base positioned on a support surface; rubber bumpers to prevent the base from sliding on the support surface; fasteners for attaching and locking a microscope in a nonmovably mounted relationship with the upper surface of the base; and manually rotatable and lockable adjusters, located at each rearward corner of the base and operatively associated with the base, to provide for selectively varying the rearward vertical height of the base and mounted microscope relative to the support surface, thereby providing a range of forward tilt angles so that a user of the microscope is able to maintain a more neutral position in the neck, back, and shoulder areas.
Claims10
An ergonomic adjustable base device for supporting a microscope and for regulating rearward vertical height of the microscope through a wide range of forward tilt angles related to a support surface to provide the microscope in an individually suitable operating condition, said device comprises:
- (a) a base means in operative contact with a microscope in forming an assembly, wherein said base means is positioned on a support surface and comprises a plate member having at least four corners, two at a forward portion and two at an opposite rearward portion;
- and
- (b) an adjusting means located at each rearward corner of the base means, said adjusting means comprises a sleeve means extendingly upwardly beyond upper surface of said base means to be readily accessible for manipulation and a shaft means received by said sleeve means, said shaft means extending between said base means and the support surface, to provide for raising and lowering a vertical height of the rearward portion relative to an elevation of the forward portion of the base means through a wide range of adjustments to provide an incline to the base means sloping downwardly from the rearward portion to the forward portion, wherein the incline to the base means provides the microscope of the assembly at a comfortable operating position.
A method for adjusting a microscope to regulate rearward vertical height of the microscope thereby raising or lowering the forwardly inclined pitch of the microscope relative to a support surface, said method comprises:
- (a) providing an adjustable base means attached to the microscope in an nonmovably mounted relationship with an upper surface of the base means;
- (b) providing rotatable adjusting means located at a rearward portion of the base means for selectively varying the rearward vertical height of the base means and the attached microscope relative to the support surface, said adjusting means comprises sleeve means extending upwardly from the base means to be readily accessible for manipulation, and shaft means received by said sleeve means and extending between said base means and the support surface;
- and
- (c) rotating the rotatable adjusting means causing the shaft means to retract into or extend out of the sleeve means thereby varying the rearward vertical height of the base means and the attached microscope thereby varying the forwardly inclined pitch of the attached microscope relative to the support surface.
Dependencies are inferred from the claim text.