Electron beam apparatus for measuring a voltage of a sample
AssigneeFujitsu Limited
InventorsAkio Ito, Hazuhiro Kakazawa, Takayuki Anbe
Life of this patent
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AssigneeFujitsu Limited
InventorsAkio Ito, Hazuhiro Kakazawa, Takayuki Anbe
Estimating the term…
An electron beam apparatus comprises, inside of an objective lens for focussing a primary electron beam e1 and irradiating it on a sample surface, a secondary electron energy analyzer having a retarding mesh electrode for analyzing the energy of a secondary electron e2 emitted from a point on the sample surface at which the primary electron beam e1 is irradiated. The secondary electron energy analyzer comprises a collimation unit for forming one or more electrostatic lenses by a nonuniform electrical field distribution and for having an electrostatic lens collimate the trajectory of a secondary electron e2 for its injection into a retarding grids (mesh electrode). The collimation unit comprises at least three cylindrical electrodes positioned between the sample surface and the retarding grid (mesh electrode) and numbered first, second and third from the one closest to the sample surface. An external power supply module applies an appropriate voltage to each of these cylindrical electrodes for having each duo of neighboring cylindrical electrodes form an electrostatic lens.
An electron beam apparatus having, inside of an objective lens for focusing a primary electron beam and irradiating it on a sample surface, a secondary electron energy analyzer for analyzing the energy of a secondary electron emitted from a point on said sample surface at which said primary electron beam is irradiated, said secondary electron energy analyzer comprising:
An electron beam apparatus having, inside of an objective lens for focussing a primary electron beam and irradiating it on a sample surface, a secondary electron energy analyzer for analyzing the energy of a secondary electron emitted from a point on said sample surface at which said primary electron beam is irradiated, said objective lens being a magnetic field type refracting an electron by a magnetic field distribution, said secondary electron energy analyzer comprising:
An electron beam apparatus having, inside of an objective lens for focussing a primary electron beam and irradiating it on a sample surface, a secondary electron energy analyzer for analyzing the energy of a secondary electron emitted from a point on said sample surface at which said primary electron beam is irradiated, said objective lens being an electrical field type refracting an electron by an electric field distribution, said secondary electron energy analyzer comprising:
A method for energy analysis and detection of an electron emitted radially from a point, comprising the steps of:
Dependencies are inferred from the claim text.