Method and apparatus for testing an immunity to electromagnetic interference and apparatus for irradiating radio wave for immunity test
AssigneeNEC Corporation
InventorsEiji Hankui, Takashi Harada
Life of this patent
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AssigneeNEC Corporation
InventorsEiji Hankui, Takashi Harada
Estimating the term…
An apparatus for measuring an electromagnetic wave stress of an article includes an electromagnetic wave irradiation unit comprising a plurality of radiation probes being adjacent to each other along a surface of the article at least on one side thereof so as to permit the probes to irradiate independently electromagnetic waves on divided local areas on a surface of the article corresponding to the locations of the probes. The apparatus also includes a control unit electrically connected to the article for receiving output signals having information as to existences of any abnormalities in individual divided local areas in the article exposed to an electromagnetic wave irradiation, the control unit being electrically connected to the transmitted unit for controlling operations of the transmitter unit to control independently an excitation of each radiation probe.
An electromagnetic wave irradiation unit to be used for electromagnetic wave stress test for an article comprising:
An apparatus for measuring an electromagnetic wave stress of an article comprising:
An electromagnetic wave irradiation unit for electromagnetic wave stress testing of an article, comprising:
Dependencies are inferred from the claim text.