Inspection method and an inspection apparatus for a temporarily bundled circuit of a wire harness
AssigneeSumitomo Wiring Systems, Ltd.
InventorsTadashi Kawamura, Norio Ohta
Life of this patent
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AssigneeSumitomo Wiring Systems, Ltd.
InventorsTadashi Kawamura, Norio Ohta
Estimating the term…
An inspection method and an inspection apparatus can readily and reliably test a temporarily bundled circuit in which each end of the wires 22A, 22B, 22C, 22D, and 22E is free. A temporary bunling connector 18 is coupled to an inspection connector 19. Each of the wires 22A, 22B, 22C, 22D, and 22E is drawn so that each of the terminals 21 passes between electrodes 11 in a gate electrode unit 5. Each of the indicator lamp 16 on a circuit checker 15 is respectively lit when each of the terminals 21 contacts with each of the electrodes 11 upon passing through the unit 5. The indicator lamp 16 is not lit if there is any fault such as misplacement or breakage of a wire, as there is no electrical communication between the terminal 21 and the electrode 11 in such a case.
In an inspection method for a temporarily bundled circuit of a wire harness in which each wire is connected to a connector at one end and is provided with a terminal at the other end, said inspection method for the temporarily bundled circuit of the wire harness is characterized in that:
An inspection apparatus for at least one temporarily bundled plurality of wires wherein each of said wires is connected to a wire connector at one end and is provided with a terminal at its other end, said inspection apparatus comprising
An inspection method for a temporarily bundled circuit of a wire harness in which each wire is connected to a connector at one end and is provided with a terminal at the other end, said inspection method comprising
Dependencies are inferred from the claim text.