Method for monitoring an area of the surface of the earth
AssigneePrakla-Seismos GmbH
InventorsWolfgang Korbmacher, Uwe Scharf
Life of this patent
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Abstract
A method for monitoring an area of the surface of the earth uses measurement probes arranged in a grid for determining the self-potential with respect to a base probe. The measurement probes are interrogated repeatedly. The earth resistance between measurement probes and the base probe is also measured repeatedly between measurements of self-potential. Potentials on the surface of an area of the earth can be determined precisely, independently of earth-resistance changes.
Claims5
A method using a central data processor and a plurality of memory units for monitoring an area of the surface of the earth to determine the self potential at a plurality of probes relative to a base probe comprising the steps of
- embedding a base probe in the surface to be monitored, embedding a plurality of non-polarizable measurement probes in a grid pattern in the surface to be monitored,
- interrogating the measurement probes repeatedly to determine measured values of self-potential,
- repeatedly measuring the earth resistance between pairs of probes including at least one of the measurement probes and the base probe immediately adjacent in time to a measurement of the self-potential at the at least one measurement probe, successive measurements of the earth resistance and of the self-potentials being made between the same probe pairs,
- each pair of measurement probes being operatively associated with a memory unit, the method further including
- repeatedly substantially simultaneously detecting and transmitting self-potential values in analog form from the measurement probes to the associated memory unit,
- buffer storing the transmitted self-potential values in the memory units,
- measuring the earth resistance between successive measurements of self-potential values,
- transmitting the earth resistance measurements in analog form to the memory unit,
- buffer storing the earth resistance measurements in the memory units,
- converting buffer-stored data from analog to digital form, and repeatedly interrogating the buffer stored data of all probe groups with the central data processor.
Dependencies are inferred from the claim text.