Magneto-optical recording medium
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsHideo Kaneko, Katsushi Tokunaga, Yoshio Tawara, Yoshiaki Shimizu, Tadao Nomura
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AssigneeShin-Etsu Chemical Co., Ltd.
InventorsHideo Kaneko, Katsushi Tokunaga, Yoshio Tawara, Yoshiaki Shimizu, Tadao Nomura
Estimating the term…
A magneto-optical recording medium having a layered structure consisting of a first dielectric layer, magnetic recording layer, second dielectric layer and reflecting layer successively formed on a transparent substrate plate can be imparted with improved performance relative to the recording sensitivity and the C/N ratio when the recording layer and the second dielectric layer each have such a thickness that the angle .delta. given by the equation .delta.=tan.sup.-1 (.epsilon./.theta.k), in which .epsilon. is the Kerr ellipticity of the regenerative light and .theta.k is the Kerr rotation angle, does not exceed 10.degree., the thickness of the recording layer being in the range from 8 nm to 13.5 nm and the thickness of the second dielectric layer satisfying the relationship given by the inequality 0.06.ltoreq.nd/.lambda..ltoreq.0.14, in which d is the thickness of the second dielectric layer, .lambda. is the wavelength of the regenerative light for reading-out of the recorded signals and n is the refractive index of the material forming the second dielectric layer to the regenerative light of wavelength .lambda..
A magneto-optical recording medium which is an integral body consisting of a substrate plate, a first dielectric layer formed on the substrate plate, a recording layer formed on the first dielectric layer, a second dielectric layer formed on the recording layer and a reflecting layer formed on the second dielectric layer, wherein each of the recording layer and the second dielectric layer has such a thickness that the angle .delta. given by the equation .delta.=tan.sup.-1 (.epsilon./.theta.k), in which .epsilon. is the Kerr ellipticity of the regenerative light and .theta.k is the Kerr rotation angle, does not exceed 10.degree., the thickness of the recording layer being in the range from 8 nm to 13.5 nm and the thickness of the second dielectric layer satisfying the relationship given by the inequality
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