X-ray examination apparatus

An X-ray examination apparatus, comprising an X-ray source for forming an X-ray image by irradiation of an object by means of X-rays, an X-ray image intensifier for converting the X-ray image into an optical image, and an image pick-up device for forming an electronic image signal from the optical image, which image pick-up device comprises an exposure control means for applying a control signal, derived from the electronic image signal, to a control input of an amplifier of the image pick-up device, which exposure control means comprises selection means for selecting at least one measuring field in the optical image, a maximum detector for detecting a maximum level derived from a maximum value of signal amplitudes of the image signal corresponding to at least one measuring field, a minimum detector for detecting a minimum level derived from a minimum value of signal amplitudes of the image signal corresponding to at least one measuring field, and a mean value detector for detecting a mean level derived from a mean value of signal amplitudes of the image signal corresponding to at least one measuring field, characterized in that the exposure control means is also operative to form the control signal with the maximum level when the mean level exceeds a first limit value, with the minimum level when the mean level drops below a second limit value, and with a signal level which varies smoothly between the two limit values as a function of the mean level.