High level synthesis for partial scan testing
AssigneeNEC USA, Inc.
InventorsSujit Dey, Miodrag Potkonjak, Rabindra K. Roy
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AssigneeNEC USA, Inc.
InventorsSujit Dey, Miodrag Potkonjak, Rabindra K. Roy
Estimating the term…
A method for performing high level synthesis of integrated circuits simultaneously considers testability and resource utilization. The method considers the relationship between hardware sharing, loops in the synthesized data path, and partial scan testing overhead. Hardware sharing is used to minimize the quantity of scan registers required to synthesize data paths with a minimal quantity of loops. A random walk based algorithm is used to break all control data flow graph (CDFG) loops with a minimal quantity of scan registers. Subsequent scheduling and assignment avoids the formation of loops in the data path by reusing the scan registers, while ensuring high resource utilization of the components of hardware costs: execution units, registers and interconnects. The partial scan overhead incurred is less than that of conventional gate level design partial scan techniques.
A method of high level synthesis of an integrated circuit including execution units for partial scan testing from a control data flow graph (CDFG) description of the integrated circuit comprising the steps of:
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