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US 5,512,839 AGranted
Test probe for electrical measuring instruments, particularly for voltmeters
AssigneeMDM Elektrosystem AG
InventorEdoardo De Monaco
Life of this patent
Estimating the term…
Abstract
The test probe for electrical measuring instruments, particularly for voltmeters, is characterized by an automatic holding device that automatically holds the test probe in a socket-outlet jack of any given design, which device comprises a contact spring at least partially adjacent to a contact pin and bilaterally bulging toward the tip of the contact pin. This results in a universally utilizable test probe that will hold automatically in any jack format of different socket-outlets, shock-hazard protection being ensured at all times.
Claims3
A test probe for an electrical measuring instrument, comprising:
- a housing;
- a contact pin having a portion projecting from said housing and forming a probe tip;
- and
- automatic holding means for automatically holding the test probe in a variety of different types of socket-outlet jacks, and comprising:
- a contact spring partially adjacent to the portion of said contact pin and bilaterally bulging toward the probe tip;
- a compression spring located within said housing;
- and
- a shock-hazard protection sleeve coaxially slidable along said contact pin and against a force of said compression spring into a first position, and being slidable to at least partially encompass said contact spring in at least a second position.
5 more elements
Dependencies are inferred from the claim text.