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US 5,510,719 AGranted
Method for screening early failure of ceramic capacitor
AssigneeMurata Manufacturing Co., Ltd.
InventorShigekatsu Yamamoto
Life of this patent
Estimating the term…
Abstract
A method of screening ceramic capacitors. The method includes the steps of: charging the ceramic capacitors by applying a constant d.c. voltage which is larger than the rated voltage and smaller than the breakdown voltage; and leaving the charged ceramic capacitor in a temperature around the maximum working temperature for a specific period of time with both terminals of each ceramic capacitor opened electrically; and eliminating defective capacitors whose residual voltage values are smaller than a specific voltage value.
Claims6
A method of screening early failure of ceramic capacitors comprising the steps of:
- charging each ceramic capacitor by applying a d.c. voltage which is larger than a rated voltage of the ceramic capacitor and smaller than a breakdown voltage of the ceramic capacitor;
- opening both terminals of each of the charged ceramic capacitors electrically, and leaving the capacitors for a predetermined period of time at a temperature around a predetermined maximum working temperature;
- measuring residual voltage values of the ceramic capacitors after said predetermined period of time, identifying capacitors whose residual voltage values are smaller than a predetermined voltage value as being defective, and eliminating such defective capacitors.
Dependencies are inferred from the claim text.