Method for forming a functional deposited film by bias sputtering process at a relatively low substrate temperature
AssigneeCanon Kabushiki Kaisha
InventorsNobuyuki Okamura, Atsushi Yamagami
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AssigneeCanon Kabushiki Kaisha
InventorsNobuyuki Okamura, Atsushi Yamagami
Estimating the term…
In a bias sputtering method comprising generating a plasma of a sputtering gas between a target electrode having a target thereon and a substrate electrode having a substrate for film formation thereon in a vacuum vessel with the use of a high frequency energy from a high frequency power source and sputtering said target with said plasma while applying a direct current voltage from a direct current power source to at least one of said target electrode or said substrate electrode thereby causing the formation of a film on said substrate, the improvement which comprises alternately repeating a deposition step and a non-deposition step, said deposition step comprising sputtering said target with said plasma while irradiating said substrate with ions of said plasma while depositing a film on said substrate, and said non-deposition step comprising irradiating said substrate with ions of said plasma without sputtering said target, thereby forming a high quality functional deposited film on said substrate.
A process for forming a functional epitaxial film on a substrate by a bias sputtering method comprising generating a plasma of a sputtering gas between a target electrode having a target thereon and a substrate electrode having a substrate for film formation thereon in a vacuum vessel with the use of a high frequency energy with a frequency of 50 MHz to 300 MHz from a high frequency power source and sputtering said target with said plasma while applying a direct current voltage from a direct current power source to at least one of said target electrode and said substrate electrode thereby causing the formation of a film on said substrate, wherein a deposition step and a non-deposition step are alternately repeated, said deposition step comprising sputtering said target with said plasma while irradiating said substrate with ions of said plasma while depositing a film on said substrate, and said non-deposition step comprising irradiating said substrate with ions of said plasma without sputtering said target, thereby forming a high quality functional epitaxial film on said substrate.
Dependencies are inferred from the claim text.