Direct etch processes for the manufacture of high density multichip modules
AssigneeLitel Instruments
InventorsRobert O. Hunter, Jr., Adlai H. Smith, Bruce B. McArthur
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AssigneeLitel Instruments
InventorsRobert O. Hunter, Jr., Adlai H. Smith, Bruce B. McArthur
Estimating the term…
The process of the manufacture of both the conductive layers and dielectric layers of multichip modules of the deposited variety is set forth with direct etch techniques being substituted for photolithography. Simply stated, entire circuit layers of the modules are directly etched or patterned with the circuit configuration required. Three processes are disclosed for processing the individual layers including subtractive patterning of a metallic conductor layer and direct patterning of the dielectric layer; direct etch metal processing (DEMI) involving direct removal of the metal layer with subsequent direct patterning of the dielectric layer; and, plating form process involving additive metallization and direct etching of the dielectric layer. By utilizing the disclosed processes alone or in combination, fabrication of multichip modules can occur.
A process for the manufacture of multichip modules of the deposited variety having metallic traces in a required circuit pattern comprising the steps of:
A process for the manufacture of multichip modules of the deposited variety having metallic traces in a required circuit pattern comprising the steps of:
A process for the manufacture of multichip modules of the deposited variety having metallic traces in a required circuit pattern comprising the steps of:
A process for the manufacture of multichip modules of the deposited variety having metallic traces in a required circuit pattern comprising the steps of:
A process for the manufacture of multichip modules of the deposited variety having metallic traces in a required circuit pattern comprising the steps of:
A process for the manufacture of multichip modules of the deposited variety having metallic traces in a required circuit pattern comprising the steps of:
Dependencies are inferred from the claim text.