A method of manufacturing a superconducting device, comprising the steps of forming on a principal surface of a substrate a first non-superconducting oxide layer having a similar crystal structure to that of a c-axis oriented oxide superconductor thin film, forming on the first non-superconducting oxide layer a second non-superconducting oxide layer having a similar crystal structure to that of an a-axis oriented oxide superconductor thin film, selectively etching a center portion of the second non-superconducting oxide layer so that the portion is completely removed and the surface of the first non-superconducting oxide layer is exposed and the second non-superconducting oxide layer is divided into two portions separated each other, forming an oxide superconductor thin film over the exposed surface of the first non-superconducting oxide layer and the two separated portions of the second non-superconducting oxide layer so that the portion of the oxide superconductor thin film on the exposed surface of the first non-superconducting oxide layer become c-axis oriented and the portions of the oxide superconductor thin film on and near the separated portions of the second non-superconducting oxide layer are a-axis oriented, etching back the oxide superconductor thin film so that the portions of the oxide superconductor thin film on the separated portions of the second non-superconducting oxide layer are completely removed and a superconducting channel, a superconducting source region and a superconducting drain region having the same thickness as that of the separated portions of the second non-superconducting oxide layer is formed between the separated portions of the second non-superconducting oxide layer, and forming a gate insulator and a gate electrode stacked on the gate insulator on a center portion of the superconducting channel.