Electronic test instrument for component test

A test instrument comprising:

• digital means for generating a periodic test stimulus waveform;
• means for applying the test stimulus waveform to a DUT;
• a single-channel input means for measuring predetermined parameters at the DUT;
• data acquisition means coupled to the input means for acquiring measurement data and for converting the acquired measurement data into digital scan data;
• means for storing the digital scan data;
• trigger means coupled to the digital generating means for controlling said storing means so as to store a first series of scan data beginning at a predetermined trigger point relative to a first cycle of the periodic test stimulus waveform;
• the trigger means including means for controlling said storing means so as to store a second series of scan data beginning at the predetermined trigger point relative to a second cycle of the periodic test stimulus waveform;
• whereby the second series of scan data is synchronized with the first series of scan data relative to the test stimulus waveform;
• and
• display means coupled to the storing means for displaying the first and second series of scan data together so as to form a Lissajous-type pattern.

A test instrument for component test comprising:

• a digital waveform generator for providing a periodic test stimulus waveform to a DUT;
• component test trigger means coupled to the waveform generator to provide a trigger signal at a predetermined time relative to each cycle of the test stimulus waveform;
• and
• data acquisition means coupled to receive the trigger signal for performing a voltage scan and for performing a current scan;
• the data acquisition means including means for starting each of the voltage scan and the current scan in response to the trigger signal during a different respective cycle of the test stimulus waveform, so as to maintain a predetermined phase relationship between the voltage scan and the current scan.