System having multiple subsystems and test signal source resident upon common substrate
AssigneeMicron Technology, Inc.
InventorsCharles L. Ingalls, Mark R. Thomann
Life of this patent
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Abstract
A system has multiple subsystems and a test signal source resident upon a common substrate. A first subsystem interfaces with an off-substrate functional tester during a test. The test signal source generates a first signal during the test for input to the second subsystem. The second subsystem responds performing an operation independent of operation and current state of the first subsystem. The functional tester verifies the independent operation of the first and second subsystems.
Claims26
A system formed on a substrate, the system interfacing with an off-substrate functional tester during a first test, the system comprising:
- a first subsystem which interfaces to the functional tester during the first test;
- a second subsystem for performing, during the first test, an operation independent of operation and current state of the first subsystem;
- a test signal source which generates a first signal during the first test, of the first and second subsystems only the second subsystem receiving the first signal during the first test;
- and
- wherein the first subsystem, second subsystem and test signal source are resident to the substrate.
An integrated circuit which interfaces with an off-chip integrated circuit tester during a first test, comprising:
- a first circuit which receives a test signal from the integrated circuit tester during the first test;
- a second circuit for performing, during the first test, an operation independent of operation and current state of the first circuit;
- a test signal source which generates a first signal during the first test, of the first and second circuits only the second circuit receiving the first signal during the first test;
- and
- wherein the first circuit, second circuit and test signal source reside on a common substrate.
A method of testing first and second subsystems residing on a common substrate, comprising the steps of:
- inputting to the first subsystem during a first test, a test signal from an off-substrate functional tester;
- generating a first signal at a test signal source located on the substrate;
- coupling the first signal to the second subsystem during the first test;
- measuring response of the first subsystem to the test signal and response of the second subsystem to the first signal, the second subsystem for performing an operation independent of operation and current state of the first subsystem.
Dependencies are inferred from the claim text.