Test apparatus for circuitized substrate

A test apparatus for testing a first circuitized substrate having a plurality of conductors, said test apparatus comprising:

• a base;
• first resilient means positioned upon or within said base;
• a second circuitized substrate adapted for being positioned on said base in an aligned manner therewith, said second circuitized substrate including a first plurality of conductive elements on a first surface thereof;
• a third circuitized substrate adapted for being positioned on said second circuitized substrate in aligned manner relative to said base and said second circuitized substrate, said third circuitized substrate being flexible in nature and including a first portion adapted for being positioned on said first resilient means and having a second plurality of conductive elements on a first surface thereof and a second portion having a third plurality of conductive elements on a second surface thereof opposite said first surface of said first portion, said second plurality of conductive elements contacting said conductors on said first circuitized substrate and said third plurality of conductive elements of said third substrate contacting said first plurality of conductive elements on said second circuitized substrate when said third circuitized substrate is positioned on said second circuitized substrate and said first circuitized substrate is positioned within or upon said test apparatus;
• and
• a cover for being positioned on said third circuitized substrate in an aligned manner relative to said base, said cover adapted for engaging said second portion of said third circuitized substrate to force said third plurality of conductive elements against said first plurality of conductive elements of said second circuitized substrate, said cover adapted for having said first circuitized substrate positioned within or upon said cover.