Method for forming contact pins for semiconductor dice and interconnects
AssigneeMicron Technology, Inc.
InventorsWarren M. Farnworth, Salman Akram, Alan G. Wood
Life of this patent
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AssigneeMicron Technology, Inc.
InventorsWarren M. Farnworth, Salman Akram, Alan G. Wood
Estimating the term…
A method for forming contact pins adapted to form an electrical connection with a mating contact location is provided. In a first embodiment, the contact pins are formed on an interconnect used for testing a semiconductor die and are adapted to establish an electrical connection with the bond pads of the die. In a second embodiment, the contact pins are formed directly on the bond pads of a die and can be used for establishing a permanent or temporary electrical connection to the pads. The contact pins include a base portion attached to the die or interconnect, a compliant spring segment, and a contact ball at the tip. The contact pins are formed using a wire bonding process or a welding process in which a metal wire is simultaneously heated and shaped into a compliant structure as it is attached to the die or interconnect.
A method for forming a contact structure on an interconnect, said contact structure adapted to establish an electrical connection with a contact location on a semiconductor die, said method comprising:
A method for forming a contact pin for an interconnect, said contact pin adapted to establish an electrical connection with a contact location on a semiconductor die, comprising:
A method for forming a contact pin for an interconnect, said contact pin adapted to establish an electrical connection with a contact location on a semiconductor die, comprising:
A method for forming a contact structure on a semiconductor die, said die including a substrate with integrated circuitry and a die pad in electrical communication with the integrated circuitry, said method comprising:
A method for forming a contact structure on a semiconductor die having a plurality of die pads in electrical communication with integrated circuitry formed on the die, said method comprising:
Dependencies are inferred from the claim text.