Method and apparatus for characterizing a differential circuit
AssigneeMotorola, Inc.
InventorsDavid E. Bockelman, William R. Eisenstadt
Life of this patent
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Abstract
A method and apparatus is provided for characterizing a differential circuit. A measurement system (200) is used to introduce input signals to the differential circuit and to measure corresponding output signals. Particularly, an input differential wave is introduced into the differential circuit (1010) while correspondingly measuring a differential output wave (1020) and a first common mode output wave (1030). Similarly, an input common mode wave is introduced (1040) while measuring a second differential output wave (1050) and a second common mode output wave (1060).
Claims6
A method of characterizing a differential circuit, comprising the steps of:
- introducing an input differential wave into the differential circuit and while introducing the input differential wave:
- measuring a first differential output wave;
- and
- measuring a first common mode output wave;
- and introducing an input common mode wave into the differential circuit and while introducing the input common mode wave:
- measuring a second differential output wave;
- measuring a second common mode output wave;
- determining common-mode scattering parameters in part from the first and second common mode output waves:
- determining differential-mode scattering parameters in part from the first and second differential output waves;
- and
- determining cross-mode scattering parameters in part from the first and second differential output waves and from the first and second common mode output waves.
A method of characterizing a differential circuit, comprising the steps of:
- providing a differential circuit having first and second ports;
- measuring a first differential output wave at the first and second ports while injecting an input differential wave into the first port;
- measuring a first common mode output wave at the first and second ports while injecting an input differential wave into the first port;
- measuring a second differential output wave at the first and second ports while injecting an input common mode wave into the second port;
- and
- measuring a second common mode output wave at the first and second ports while injecting an input common mode wave into the second port.
Dependencies are inferred from the claim text.