Electrochemical identification of molecules in a scanning probe microscope
AssigneeMolecular Imaging Corporation
InventorsStuart M. Lindsay, Tianwei Jing
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AssigneeMolecular Imaging Corporation
InventorsStuart M. Lindsay, Tianwei Jing
Estimating the term…
A method and apparatus for high resolution mapping of the chemical composition of a thin film utilizes scanning probe microscopy techniques. The sample to be studied is prepared as a thin film disposed on a conductive backing electrode. A sensitive electrometer is connected to the backing electrode to detect current passing through it. According to a first aspect of the invention, a force sensing cantilever is scanned relative to the sample surface a plurality of times. Topographic information about the sample surface is obtained in a conventional manner by studying deflections of the cantilever or feedback current used to minimize deflections of the cantilever. Simultaneously, a voltage is applied to the probe tip. This voltage, through a tunneling current to the backing electrode, causes reduction and/or oxidation reactions in the sample surface. On successive scans, different voltages may be used. In this way, the tunneling current at each of a number of different voltages for each location in the sample surface is obtained. Because specific oxidation and reduction reactions take place only at well defined voltages, it is possible, from the current measured at a certain location and a certain applied voltage at that location, to deduce what the chemical located at that location is. According to a second aspect of the invention, a scanning tunneling microscope mechanism may be used instead of a force sensing mechanism.
A method for identifying selected chemical substances present on a surface of a sample, said method comprising the steps of:
A method for producing a topographic image of a surface of a sample including an identification of selected chemical substances present on said sample surface, said method comprising the steps of:
An electrochemical scanning probe microscope for determining the existence and location of selected chemical substances on a surface of a sample disposed on a conductive backing electrode, said electrochemical scanning probe microscope comprising:
An electrochemical scanning probe microscope for determining the existence and location of selected chemical substances on a surface of a sample disposed on a conductive backing electrode, said electrochemical scanning probe microscope comprising:
Dependencies are inferred from the claim text.