Devices and methods for detection of an analyte based upon light interference
AssigneeBiostar, Inc.
InventorsTorbjorn Sandstrom, Lars Stiblert, Diana M. Maul
Life of this patent
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Abstract
Instrument configured and arranged to detect the presence or amount of an analyte of interest on the substrate of an optical device. The instrument has a source of linearly polarized, monochromatic light positioned at an angle other than Brewster's angle relative to the substrate; and an analyzer positioned at the same angle relative to the substrate at a location suitable for detecting reflected polarized light from the substrate; wherein the analyzer is configured and arranged to approximately maximize the change in intensity of the light reflected from the substrate that is transmitted through the analyzer when a change in mass occurs at the substrate relative to an unreacted surface.
Claims14
An instrument configured and arranged to detect the presence or amount of an analyte of interest on a multilayered thin film substrate comprising an adhering attachment layer to which is affixed a receptive material which specifically binds said analyte, of an optically active device wherein said attachment layer consists of a material selected from the group consisting of dendrimers, polymeric siloxanes, polymeric silanes, and film forming latexes, said instrument comprising:
- a light source providing monochromatic light that is linearly polarized, positioned at an angle other than Brewster's angle relative to the substrate;
- and
- a detector and analyzing polarizer positioned at said angle relative to said substrate at a location suitable for detecting reflected polarized light from said substrate;
- wherein said analyzing polarizer is positioned to maximize the change in the polarization rotation or ellipticity as measured by the intensity of light reflected from the substrate that is transmitted to the detector when analyte is present on said substrate and a change in mass occurs at said substrate relative to said substrate in the absence of said analyte, thereby indicating the presence of said analyte.
A method for optimizing an instrument
- configured and arranged to detect the presence or amount of an analyte of interest on a multilayered thin film substrate comprising an adhering attachment layer to which is affixed a receptive material which specifically binds said analyte, of an optically active device wherein said attachment layer consists of a material selected from the group consisting of dendrimers, polymeric siloxanes, polymeric silanes, and film forming latexes, said instrument comprising:
- a light source providing monochromatic light that is linearly polarized, positioned at an angle other than Brewster's angle relative to the substrate;
- an incident polarizer;
- and
- a detector and analyzing polarizer positioned at said angle relative to said substrate at a location suitable for detecting reflected polarized light from said substrate, comprising the step of:
- positioning the analyzing polarizer relative to the incident polarizer so as to minimize polarization rotation or ellipticity of the light reflected from said substrate when said analyte is not present on said substrate and so as to maximize the change in polarization rotation or ellipticity as measured by the intensity of light reflected from said substrate that is transmitted to said detector when analyte is present on said substrate and a change in mass occurs at said substrate relative to said substrate when analyte is not present on said substrate.
A method for detecting the presence or amount of an analyte of interest on a multilayered thin film substrate comprising an adhering attachment layer to which is affixed a receptive material which specifically binds said analyte, of an optically active device wherein said attachment layer consists of a material selected from the group consisting of dendrimers, polymeric siloxanes, polymeric silanes, and film forming latexes, utilizing an optical instrument comprising;
- a source of linearly polarized light positioned at an angle other than Brewster's angle relative to said substrate;
- an incident polarizer;
- a detector and an analyzing polarizer positioned at said angle relative to said substrate at a location suitable for detecting reflected polarized light from said substrate;
- and
- said analyzing polarizer is further positioned to maximize the change in the polarization rotation or ellipticity as measured by the intensity of light reflected from the substrate that is transmitted to the detector when analyte is present on said substrate and a change in mass occurs at said substrate relative to said substrate in the absence of said analyte, comprising the steps of:
- a) contacting said receptive material with said analyte so as to cause said analyte to be present on said substrate;
- and
- b) detecting with said detector said change in intensity of light reflected from said substrate when said analyte is present on said substrate, thereby indicating the presence of said analyte.
Dependencies are inferred from the claim text.