Method of forming deposition film
AssigneeCanon Kabushiki Kaisha
InventorsShigeyuki Matsumoto, Osamu Ikeda
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AssigneeCanon Kabushiki Kaisha
InventorsShigeyuki Matsumoto, Osamu Ikeda
Estimating the term…
This invention provides a method of forming a deposition film serving as a high-quality wiring layer having good stress migration durability against any material such as a non-monocrystalline material. A substrate is located in a deposition film formation space, a gas of an alkylaluminum halide is supplied to the deposition film formation space, and an aluminum film is selectively formed on an electron donor surface at a partial pressure of the alkylaluminum halide of 7.times.10.sup.-3 Torr to 9.times.10.sup.-2 Torr in the range of a decomposition temperature or more of the alkylaluminum halide and 450.degree. C. or less. When deposition is to be performed on the non-monocrystalline material, a chemical treatment for terminating with hydrogen atoms a non-electron donor surface of a substrate having the electron donor surface and the non-electron donor surface is performed, and the deposition film is deposited by a non-selective deposition method.
A method of forming a deposition film, comprising steps of:
A method of forming a deposition film, comprising the steps of:
Dependencies are inferred from the claim text.