X-ray diffraction apparatus
AssigneeThe United States of America as represented by the Administrator of the National Aeronautics and Space Administration
InventorsDavid F. Blake, Charles Bryson, Friedemann Freund
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Abstract
An x-ray diffraction apparatus for use in analyzing the x-ray diffraction pattern of a sample. The apparatus includes a beam source for generating a collimated x-ray beam having one or more discrete x-ray energies, a holder for holding the sample to be analyzed in the path of the beam, and a charge-coupled device having an array of pixels for detecting, in one or more selected photon energy ranges, x-ray diffraction photons produced by irradiating such a sample with said beam. The CCD is coupled to an output unit which receives input information relating to the energies of photons striking each pixel in the CCD, and constructs the diffraction pattern of photons within a selected energy range striking the CCD.
Claims6
X-ray diffraction apparatus for use in analysing the x-ray diffraction pattern of a sample, consisting essentially of,
- a beam source for generating a collimated x-ray beam having one or more discrete x-ray energies,
- a holder for holding the sample to be analysed in the path of said beam,
- a charge-coupled device having a 2-dimensional array of pixels for detecting, in one or more selected photon energy ranges, x-ray diffraction photons produced by irradiating such a sample with said beam, and
- means coupled to said charge-coupled device for receiving input information relating to the energies of photons striking each pixel in said device, for use in reporting the diffraction pattern of photons within a selected energy range striking said device.
X-ray diffraction apparatus for use in analyzing the x-ray diffraction pattern of a sample, comprising
- a beam source for generating a collimated x-ray beam having one or more discrete x-ray energies, wherein said beam is designed to produce multiple x-ray energies in the beam,
- a holder for holding the sample to be analyzed in the path of said beam,
- a charge-coupled device having a 2-dimensional array of pixels for detecting, in one or more selected photon energy ranges, x-ray diffraction photons produced by irradiating such a sample with said beam, wherein said charge-coupled device is operated to measure the distribution of x-ray diffraction photons within one selected energy range, and
- means coupled to said charge-coupled device for receiving input information relating to the energies of photons striking each pixel in said device, for use in reporting the diffraction pattern of photons within a selected energy range striking said device.
X-ray diffraction apparatus for use in analyzing the x-ray diffraction pattern of a sample, comprising
- a beam source for generating a collimated x-ray beam having one or more discrete x-ray energies, wherein said beam is designed to produce multiple x-ray energies in the beam,
- a holder for holding the sample to be analyzed in the path of said beam,
- a charge-coupled device having a 2-dimensional array of pixels for detecting, in one or more selected photon energy ranges, x-ray diffraction photons produced by irradiating such a sample with said beam, wherein said charge-coupled device is operated to measure the distributions of x-ray diffraction photons within two or more selected energy ranges and
- means coupled to said charge-coupled device for receiving input information relating to the energies of photons striking each pixel in said device, for use in reporting the diffraction pattern of photons within a selected energy range striking said device.
Dependencies are inferred from the claim text.