Solder-bonded structure
AssigneeKabushiki Kaisha Tokai Rika Denki Seisakusho
InventorsMasakata Kanbe, Hitoshi Iwata, Kenichi Kinoshita
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Abstract
An improved solder-bonding structure is disclosed that is particularly suitable for soldering the components of hybrid ICs. The solder-bonding structure includes a conductor formed on a substrate. The conductor is formed from silver and platinum. A solder layer formed from a tin and silver solder is then formed on the conductor to couple an electronic element to the conductor. In preferred aspects of the invention, the platinum content in the conductor is in the range of approximately 0.7 to 1.0% by weight. The silver content in the solder layer is in the range of approximately 0.1 to 5.0% by weight.
Claims4
A bond for conductively attaching an electronic part to a substrate, the bond comprising:
- a conductor comprised of silver formed upon the substrate;
- and
- a solder layer consisting of tin and silver, the content of silver in the solder layer being between approximately 0.1 and 5.0 percent by weight, such that the silver of the conductor and the tin of the solder layer form an intermetallic compound which serves as a barrier to solder migration, the intermetallic compound being formed continuously at the boundary of the conductive layer and the solder layer during soldering.
A hybrid IC comprising:
- an alumina substrate;
- a conductor layer sintered to the substrate such that a connection layer is formed upon the substrate, the conduction layer being formed of silver and platinum, the content of platinum being between approximately 0.7 and 1.0 percent by weight;
- and
- a solder layer soldered to the conductor for coupling an electronic part to the conductor, the solder being formed from a tin-silver solder wherein the silver content of the solder is between 0.1 and 5.0 percent, by weight, such that the silver of the conductor and the tin of the solder layer form an intermetallic compound which serves as a barrier to solder migration, the intermetallic compound being formed continuously at the boundary of the conductive layer and the solder layer during soldering.
Dependencies are inferred from the claim text.