Crystalline modification of 1, 1', 1"- Nitril0 (tri-2-propyl-tris-[2,2'- ethylidene-bis (4, 6-di-tert-butylphenyl]phosphite)
AssigneeCiba-Geigy Corporation
InventorsSai P. Shum, Stephen D. Pastor
Life of this patent
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Abstract
The new crystalline modification of 1,1',1"-nitrilo{tri-2-propyl-tris[2,2'-ethylidene-bis(4,6-di-tert-butylphe nyl)]phosphite} is obtained by crystallizing said compound from the melt at elevated temperatures. This crystalline form is an effective process stabilizer for polyolefins, particularly polypropylene.
Claims15
The compound 1,1',1"-nitrilo{tri-2-propyl-tris-[2,2'-ethylidene-bis(4,6-di-tert-butylph enyl)]phosphite} having the formula I ##STR14## characterized by a melting point in the range of 254.degree.-274.degree. C.;
- and by an X-ray diffraction pattern obtained using Cu--K.alpha. which exhibits diffraction angles (20.THETA.) of very high intensity at 7.9 and 15.6;
- lines of high intensity at 7.3, 8.9, 14.7, 16.8, 18.3, 18.9, 19.8 and 20.6;
- lines of medium intensity at 13.9, 22.6 and 24.0;
- a line of weak intensity at 21.4.
A process for the preparation of the crystalline form of the compound 1,1',1"-nitrilo{tri-2-propyl-tris-[2,2'-ethylidene-bis(4,6-di-tert-butylph enyl)]phosphite} having the formula I ##STR15## characterized by a melting point in the range of 254.degree.-274.degree. C.;
- and by an X-ray diffraction pattern obtained using Cu--K.alpha. which exhibits diffraction angles (28.THETA.) of very high intensity at 7.9 and 15.6;
- lines of high intensity at 7.3, 8.9, 14.7, 16.8, 18.3, 18.9, 19.8 and 20.6;
- lines of medium intensity at 13.9, 22.6 and 24.0;
- a line of weak intensity at 21.4, which comprises
- heating a melt of the compound of formula I at a temperature in the range of 170.degree. to 200.degree. C. crystallize the novel crystalline modification.
A composition stabilized against thermal, oxidative and actinic induced degradation which comprises
- (a) an organic material subject to thermal, oxidative and actinic induced degradation, and
- (b) an effective stabilizing mount of the crystalline form of 1,1',1"-nitrilo{tri-2-propyl-tris-[2,2'-ethylidene-bis(4,6-di-tert-butylph enyl)]phosphite} having the formula I ##STR16## characterized by a melting point in the range of 254.degree.-274.degree. C.;
- and by an X-ray diffraction pattern obtained using Cu--K.alpha. which exhibits diffraction angles (20.THETA.) of very high intensity at 7.9 and 15.6;
- lines of high intensity at 7.3, 8.9, 14.7, 16.8, 18.3, 18.9, 19.8 and 20.6;
- lines of medium intensity at 13.9, 22.6 and 24.0;
- a line of weak intensity at 21.4.
Dependencies are inferred from the claim text.