Mass spectrometer

A mass spectrometer comprising:

• an ionization region for ionizing a sample under atmospheric pressure;
• an ion sampling aperture for introducing ions generated in said ionization region into a vacuum;
• and
• a mass analysis region for mass analyzing said ions on the basis of a high-frequency electric field, wherein:
• an electrostatic lens for deflecting a direction of movement of said ion from a center axis of said ion sampling aperture in arranged between said ionization region and said mass analysis region;
• and
• a center axis of an aperture for introducing ions into said mass analysis region and the center axis of said ion sampling aperture intersect.

A mass spectrometer comprising:

• an ionization region for ionizing a sample under atmospheric pressure;
• an ion sampling aperture for introducing ions generated in said ionization region into a vacuum;
• and
• a mass analysis region for mass analyzing said ions on the basis of a high-frequency electric field, wherein:
• an electrostatic lens for deflecting a direction of movement of said ion from a center axis of said ion sampling aperture is arranged between said ionization region and said mass analysis region;
• and
• a center axis of an aperture for introducing ions into said mass analysis region and the center axis of said ion sampling aperture are arranged in by parallel and offset from each other and so that projection of said ion sampling aperture onto a plane perpendicular to these center axes and projection of said ion introducing aperture onto said plane do not overlap each other.

A mass spectrometer comprising:

• a nebulization ion source in which an effluent introduced from a liquid chromatograph into one end of a capillary is nebulized from the other end of said capillary to thereby generate ions;
• an ion sampling aperture for introducing the generated ions into a vacuum;
• a quadrupole mass spectrometer for mass analyzing said ions on the basis of a high-frequency electric field;
• and
• an electrostatic lens arranged between said nebulization ion source and said quadrupole mass spectrometer for deflecting a direction of movement of said ions from a center axis of said ion sampling aperture, wherein:
• said electrostatic lens is constituted by a cylindral inner electrode and a cylindrical outer electrode arranged on the outside of said inner electrode;
• holes are formed at least in a surface of a cylinder constituting said inner electrode;
• and
• a center axis of an aperture for introducing ions into said quadrupole mass spectrometer and the center axis of said ion sampling aperture are arranged in by parallel and offset from each other.

A mass spectrometer comprising:

• a nebulization ion source in which an effluent introduced from a liquid chromatograph into one end of a capillary is nebulized from the other end of said capillary to thereby generate ions;
• an ion sampling aperture for introducing the generated ions into a vacuum;
• an ion trap mass spectrometer for enclosing said ions on the basis of a high-frequency electric field;
• and
• an electrostatic lens disposed between said nebulization ion source and said ion trap mass spectrometer or for deflecting a direction of movement of said ions from a center axis of said ion sampling aperture, wherein:
• said electrostatic lens is constituted by a cylindrical inner electrode and a cylindrical outer electrode arranged on the outside of said inner electrode;
• holes are formed at least in an outer circumferential surface of a cylinder constituting said inner electrode;
• and
• a center axis of an aperture for introducing ions into said ion trap mass spectrometer and the center axis of said ion sampling aperture are arranged in parallel and offset from each.

A mass spectrometer comprising:

• an ion source for generating plasma and for introducing a sample into the plasma to thereby generate ions;
• an ion sampling aperture for introducing the generated ions into a vacuum;
• a mass analysis region for mass analyzing said ions on the basis of a high-frequency electric field;
• and
• an electrostatic lens disposed between said ion source and said mass analysis region for deflecting a direction of movement of said ions from a center axis of said ion sampling aperture, wherein:
• said electrostatic lens is constituted by a cylindrical inner electrode and a cylindrical outer electrode arranged on the outside of said inner electrode;
• holes are formed at least in an outer circumferential surface of a cylinder constituting said inner electrode;
• and
• a center axis of an aperture for introducing ions into said mass analysis region and the center axis of said ion sampling aperture are arranged in parallel and offset from each other.

A mass spectrometer comprising:

• an ionization region for ionizing a sample under atmospheric pressure;
• an ion sampling aperture for introducing ions generated in said ionization region into a vacuum;
• a Fourier transformation ion cyclotron resonance mass spectrometer for making said ions rotate in an intensive magnetic field to thereby mass analyze said ions on the basis of the rotational frequency of said ions;
• and
• an electrostatic lens arranged between said ionization region and said mass spectrometer for deflecting a direction of movement of said ion from a center axis of said ion sampling aperture;
• wherein:
• said electrostatic lens is constituted by a cylindrical inner electrode and a cylindrical outer electrode arranged on the outside of said inner electrode;
• holes are formed at least in an outer circumferential surface of a cylinder constituting said inner electrode;
• and
• a center axis of an aperture for introducing ions into said mass spectrometer and the center axis of said ion sampling aperture are arranged in parallel and offset from each other.

A mass spectrometer, comprising:

• an ionization region for ionizing a sample under atmospheric pressure;
• a first aperture for introducing ions generated in said ionization region into an intermediate pressure region;
• a second aperture for introducing said ions into a vacuum region from said intermediate pressure region;
• a mass analysis region for mass analyzing said ions on the basis of a high-frequency electric field, said mass analysis region being arranged in said vacuum region;
• a third aperture for introducing said ions passing through said second aperture into said mass analysis region;
• and
• an electrostatic ion deflecting lens for deflecting a direction of movement of said ions from the center of axis of said second aperture, said electrostatic ion deflecting lens being arranged between said second aperture and said third aperture in said vacuum region;
• wherein a center axis of said third aperture and a center axis of said second aperture are arranged in parallel and offset from each other.

A mass spectrometer, comprising:

• an ionization region for ionizing a sample under atmospheric pressure;
• a first aperture for introducing ions generated in said ionization region into an intermediate pressure region;
• a second aperture for introducing said ions into a vacuum region from said intermediate pressure region;
• a mass analysis region for analyzing said ions on the basis of a high-frequency electric field, said mass analysis region being arranged in said vacuum region;
• a third aperture for introducing said ions passing through said second aperture into said mass analysis region;
• and
• an electrostatic ion deflecting lens for deflecting a direction of movement of said ions from the center axis of said second aperture, said electrostatic ion deflecting lens being arranged between said second aperture and said third aperture in said vacuum region;
• wherein a center axis of said third aperture and a center axis of said second aperture intersect.

A mass spectrometer, comprising:

• an ionization region for ionizing a sample under atmospheric pressure;
• a first aperture for introducing ions generated in said ionization region into an intermediate pressure region;
• a second aperture for introducing said ions into a vacuum region from said intermediate pressure region;
• a mass analysis region for mass analyzing said ions on the basis of a high-frequency electric field, said mass analysis region being arranged in said vacuum region;
• a third aperture for introducing said ions passing through said second aperture in to said mass analysis region;
• and
• an electrostatic ion deflecting lens for deflecting a direction of movement of said ions from the center axis of said second aperture, said electrostatic ion deflecting lens being arranged between said second aperture and said third aperture in said region;
• wherein said electrostatic ion deflecting lens is constituted by a cylindrical inner electrode and an outer electrode arranged on the outside of said inner electrode.

A mass spectrometer, comprising:

• an ionization region for ionizing a sample under atmospheric pressure;
• a first aperture for introducing ions generated in said ionization region into an intermediate pressure region;
• a second aperture for introducing said ions into a vacuum region from said intermediate pressure region;
• a mass analysis region for mass analyzing said ions on the basis of a high-frequency electric field, said mass analysis region being arranged in said vacuum region;
• a third aperture for introducing said ions passing through said second aperture into said mass analysis region;
• and
• an electrostatic lens for deflecting a direction of movement of said ions and for focusing said ions, said electrostatic lens being arranged between said second aperture and said third aperture in said vacuum region;
• wherein said electrostatic ion lens deflects the direction of movement of said ions from the center axis of said second aperture.

A mass spectrometer, comprising:

• an ionization means for ionizing a sample under atmospheric pressure;
• an ion sampling aperture for introducing ions generated by said ionization mans into a vacuum;
• a mass analysis means for mass analyzing said ions on the basis of a high-frequency electric field in said vacuum;
• and
• an electrostatic lens for deflecting a direction of movement of said ions, said electrostatic lens being arranged between said ion sampling aperture and said mass analysis means;
• wherein said electrostatic ion lens deflects the direction of movement of said ions from the center of axis of said ion sampling aperture in said vacuum, and wherein center axis of an aperture for introducing said ions into said mass analysis means and the center axis of said ion sampling aperture are arranged in parallel and offset from each other.

A method for performing mass spectrometry, comprising:

• (a) ionizing a sample;
• (b) deflecting and focusing the ions using an electrostatic lens;
• and
• (c) mass analyzing said ions.