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US 5,479,110 AGranted
Printed flexible circuit terminations and method of manufacture
AssigneeAdvanpro Corporation
InventorsJesse Crane, Robert E. Vosika, Horst Franke
Life of this patent
Estimating the term…
Abstract
Flexible contact terminals configured from printed strip circuits and usable with integrated circuit test fixtures. The termination circuits include printed conductive pathways formed on a flexible, multi-layered substrate. The conductive paths are three dimensionally tailored for impedance and resilience. Circuit processing includes steps to profile etch the conductive paths at the X, Y and Z-axis, especially end terminations. A support fixture contains the termination circuits to provide resilient electrical test terminations to circuit components supported to a resilient component support.
Claims13
Electrical component test apparatus comprising:
- a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component inserted;
- b) contact means having a conductive signal layer, a ground layer and a dielectric layer;
- wherein said dielectric layer separates said signal layer and said ground layer;
- wherein said signal layer includes a plurality of laterally displaced, seamless conductive paths etched from a homogeneous conductive material of a uniform thickness;
- wherein each of said plurality of conductive paths includes first and second etched contact terminations and an interconnecting field path;
- wherein said first terminations project unsupported in laterally displace relation to one another from a peripheral edge of said dielectric layer into said first cavity;
- and wherein the vertical thickness of said first and second terminations is greater than said field path, whereby said first terminations flex upon contact with respective ones of said terminals.
4 more elements
Apparatus as set forth in claim 11 wherein said plurality of capacitors and said plurality of contacts are mounted to an electrically conductive cover and including means for insulating portions of each of said capacitors and contacts from said cover.
Electrical circuit test apparatus comprising:
- a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component inserted;
- b) contact means having a conductive signal layer, first and second ground layers and first and second dielectric layers;
- wherein said signal layer is mounted between said first and second dielectric layers;
- wherein said first and second ground layers cover said first and second dielectric layers;
- wherein said signal layer includes a plurality of seamless conductive paths;
- wherein a plurality of apertures communicate through said first and second dielectric layers with said plurality of conductive paths;
- wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path;
- wherein the vertical thickness of said first and second terminations is greater than said field path;
- and wherein said said first terminations project unsupported from a peripheral edge of said first and second dielectric layers into said first cavity;
- and
- c) a plurality of capacitors mounted to said cover means and coupled to spring means for resiliently biasing a plurality of contacts to engage each of said first terminations and for completing a plurality of circuit paths through each of said plurality of capacitors upon contacting said cover means to a component.
8 more elements
Electrical circuit test apparatus comprising:
- a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component;
- b) contact means having a conductive signal layer, a ground layer and a flexible dielectric layer;
- wherein said dielectric layer separates said signal layer and said ground layer;
- wherein said dielectric layer includes a center portion and from which radiates a plurality of wings;
- wherein said signal layer includes a plurality of seamless conductive paths;
- wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path;
- wherein the vertical thickness of said first and second terminations is greater than said field path;
- and wherein said wings are folded to envelop said body such that said first terminations project unsupported from a peripheral edge of said plurality of wings into said first cavity and said second terminations depend from beneath said body;
- and
- c) means mounted to said cover means for capacitively decoupling each of said first terminations to said ground layer at substantially the point of contact between each of said first terminations and each of said terminals.
7 more elements
Electrical circuit test apparatus comprising:
- a) a body including means for resiliently supporting a test component to said body such that a plurality of component terminals project into a first cavity disposed in said body adjacent said support means and further including cover means mounted to said body to contact each component;
- b) a component retainer having a support surface which receives a component, wherein said support surface includes first protrusions which index the component to the support surface and second protrusions which index the retainer to the second surface and spring means for resiliently biasing said component support above said second surface;
- c) contact means having a conductive signal layer, a ground layer and a dielectric layer;
- wherein said layer separates said signal layer and said ground layer;
- wherein said signal layer includes a plurality of seamless conductive paths;
- wherein each of said plurality of conductive paths includes first and second etched terminations and an interconnecting field path;
- wherein said first terminations project unsupported from a peripheral edge of said dielectric layer into said first cavity;
- and wherein the vertical thickness of said first and second terminations is greater than said field path;
- and
- c) a plurality of capacitors mounted to said cover means and coupled to spring means for resiliently biasing a plurality of contacts to engage each of said first terminations, whereby a plurality of circuit paths are resiliently completed through each of said plurality of first terminations and capacitors upon contacting said cover means to a component and said first terminations to said terminals.
7 more elements
Dependencies are inferred from the claim text.