Electro-optic voltage detector
AssigneeHamamatsu Photonics K.K.
InventorsHironori Takahashi, Shinichiro Aoshima, Yutaka Tsuchiya
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Abstract
To provide an E-O probe which can measure a voltage distribution in a fine region while enlarging it. A grounded, transparent electrode 2 and an electrooptic member 3 such as LiTaO.sub.3 are successively fixed to and below a support 1. There are a plurality of conical, conductive members 5a-5e arranged below a reflection film 4 in such a manner that the bottom surfaces thereof are fixed to the lower surface of the reflection film 4 and that the lower ends thereof project downward. Spaces between the plural, linear, electric needles 5a-5e become narrower toward a measured object located below them, whereby voltages in a fine region in the measured object can be guided as enlarged to the electrooptic member 3.
Claims16
An electro-optic voltage detector comprising:
- an electrooptic member;
- a reflection film formed on said electrooptic member;
- a first needlelike member having a first end portion and a second end portion, wherein said first end potion of said first needlelike member is fixed to said reflection film;
- and
- a second needlelike member having a first end portion and a second end portion, wherein said first end portion of said second needlelike member is fixed to said reflection film, and wherein a first distance between said first end portion of said first needlelike member and said first end portion of second needlelike member is longer than a second distance between said second end portion of said first needlelike member and said second end portion of second needlelike member.
An E-O probe comprising:
- an electrooptic member changing a refractive index thereof in accordance with an electric field applied thereto;
- and
- a plurality of needlelike, conductive members bases of which are fixed to said electrooptic member;
- wherein each space on a side of said bases between said plurality of needlelike, conductive members is greater than each space on a side of tips between said needlelike, conductive members.
Dependencies are inferred from the claim text.