STM probe
AssigneeMax-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
InventorsMatthias Forster, Bernd Tesche
Life of this patent
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AssigneeMax-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
InventorsMatthias Forster, Bernd Tesche
Estimating the term…
STM probe, in particular for use in an SEM for examining a surface of a sle by STM and/or SEM operation, comprising an outer and an inner piezotube; an object carrier plate mounted on the annular top face of the inner piezotube; a triangular head plate mounted on the annular top face of the outer piezotube and having a recess substantially concentric with the tubes in the triangle side crossing the tubes, the object carrier plate being arranged in this recess with play on all sides; a triangular test-prod attachment plate arranged at a space above the head plate and having a test-prod attachment made of an insulating material in the triangle side passing above the object carrier plate, for receiving a test prod; the corner areas of the plates being provided with fine-thread spindles for setting the space between the plates; and the two plates being held together by means of three springs engaging the corners.
STM probe (1), in particular for use in an SEM for examining a surface of a sample (28) by STM and/or SEM operation, comprising:
Dependencies are inferred from the claim text.