Method bonding for production of SOI transistor device
AssigneeSony Corporation
InventorsHiroshi Satoh, Yasunori Ohokubo, Takeshi Matsushita, Toshiyuki Nishihara, Makoto Hashimoto
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AssigneeSony Corporation
InventorsHiroshi Satoh, Yasunori Ohokubo, Takeshi Matsushita, Toshiyuki Nishihara, Makoto Hashimoto
Estimating the term…
A wafer bonding method for forming a SOI structure comprising the steps of bringing wafers into proximity in a state with one wafer a slight, substantially uniform clearance away from the other wafer and pressing one point of at least one wafer of the two wafers against the other wafer. In another aspect of the invention, there is provided a method of positioning for photolithography using an alignment mark portions and/or a vernier portions formed on a SOI substrate, which comprises the step of removing semiconductor layer portions corresponding to the alignment mark portions and/or the vernier portions. In further another aspect of the invention, there is provided a new DRAM semiconductor device formed by using SOI structure, which comprises a new pattern of a strage node formed longitudinally along a word line. Further, there is provided a new DRAM semiconductor device formed by using SOI structure, which comprises a unique strage node having a conductive side wall.
A substrate bonding method wherein first and second substrates are bonded to form a clad substrate, comprising the steps of:
A substrate bonding method wherein two substrates are bonded to form a clad substrate, comprising the steps of:
A method of bonding first and second substrates comprising the steps of:
Dependencies are inferred from the claim text.