Process for fabricating a vertical bipolar junction transistor
AssigneeUnited Microelectronics Corp.
InventorSheng-Hsing Yang
Life of this patent
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Abstract
A process for fabricating a bipolar junction transistor by forming a trench in a silicon substrate. A lightly-doped base region is formed adjacent to the sidewalls of the trench, and a heavily-doped base region is formed under the bottom of the trench. Silicon oxide layers are formed along the sidewalls and bottom of the trench with a contact window provided to expose part of the lightly-doped base region. A polysilicon layer is formed in the trench, and is heavily doped by a dopant which in turn diffuses into the lightly-doped base region through the contact window to form an emitter region. A collector region is formed in the upper surface of the lightly-doped base region.
Claims7
A process for fabricating a bipolar junction transistor comprising the following steps:
- providing a silicon substrate of a first conductivity type;
- forming, by deposition and etching, a shielding layer having an opening over said silicon substrate;
- implanting ions of a second conductivity type opposite to said first conductivity type into said silicon substrate through said opening to form a lightly-doped base region extending to the underside of said shielding layer by diffusion;
- etching said silicon substrate to form a trench by using said shielding layer as a mask;
- implanting ions of said second conductivity type into said silicon substrate through said trench to form a heavily-doped base region located under the bottom of said trench and extending to contact said lightly-doped base region by diffusion;
- forming, by oxidation, a first oxide thin-layer at the sidewalls of said trench, and a second oxide thin-layer at the bottom of said trench;
- forming a sidewall spacer at the lower corner of said trench;
- forming, by oxidation, an isolation oxide thick-layer at the surfaces uncovered by said shielding layer and said sidewall spacer;
- removing said sidewall spacer, said shielding layer, and said first oxide thin-layer previously covered by said sidewall spacer in order to form a contact window in said trench;
- forming, in said trench, a conductive layer heavily doped by a dopant of said first conductivity type, said dopant diffusing into said lightly-doped base region through said contact window to form an emitter region;
- and
- forming a collector region of said first conductivity type in the upper surface of said lightly-doped base region.
Dependencies are inferred from the claim text.