Nonvolatile semiconductor memory apparatus
AssigneeKabushiki Kaisha Toshiba
InventorsYoshiyuki Tanaka, Tomoharu Tanaka, Koji Sakui, Hiroshi Nakamura, Kazunori Ohuchi, Hideko Oodaira, Yutaka Okamoto
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AssigneeKabushiki Kaisha Toshiba
InventorsYoshiyuki Tanaka, Tomoharu Tanaka, Koji Sakui, Hiroshi Nakamura, Kazunori Ohuchi, Hideko Oodaira, Yutaka Okamoto
Estimating the term…
A nonvolatile semiconductor memory apparatus of the present invention has a feature that charging of a control gate of a nonselective memory cell is simultaneously executed upon charging of a bit line. That is, in the case of normal reading (random accessing), charging of the control gate of the nonselective memory cell is conducted previously to at least one of source and drain side selective gates. Then, when the threshold value of the memory cell in the case of erasing the cell is judged, in a read mode, charging of the selective gate is started by delaying from the timing of charging the control gate of the nonselective memory cell to negative. That is, the selective gate is closed until the control gate is completely set to a negative testing voltage to prevent the bit line from being discharged. After the control gate is completely set to the negative testing voltage, the selective gate is delayed to be charged so that the selective gate is turned ON.
A nonvolatile semiconductor memory device comprising:
A nonvolatile semiconductor memory apparatus, comprising:
An electrically erasable nonvolatile memory device comprising:
Dependencies are inferred from the claim text.
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Auxiliary circuits, e.g. for writing into memory: address circuits; Decoders; Word-line control circuits
Auxiliary circuits, e.g. for writing into memory: programming or data input circuits
Sensing or reading circuits; Data output circuits: using differential sensing or reference cells, e.g. dummy cells
Static stores
Term ended 19 Dec 2012 (estimated)
USPTO file history isn’t available for this patent, so only indexed dates are shown.
1. Field of the Invention
The present invention relates to an electrically rewritable nonvolatile semiconductor memory (EEPROM) and, more particularly, to an EEPROM having a memory cell array of a NAND cell construction.
2. Description of the Related Art
The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate presently preferred embodiments of the present invention and, together with the general description given above and the detailed description of the preferred embodiments given below, serve to explain the principles of the present invention in which:
FIG. 1 is a view showing an algorithm of a conventional verifying operation;
FIG. 2 is a view showing an example of a construction of a NAND cell type EEPROM system according to one embodiment of the present invention;
An embodiment of the present invention will be described below with reference to the accompanying drawings.
FIG. 2 shows an example of a construction of a NAND cell type EEPROM system according to an embodiment of the present invention. A plurality of NAND cell type EEPROM chips 1 are rewritten by a control circuit LSI chip 2 for controlling according to an algorithm to be described in detail later.
FIG. 3A and FIG. 3B respectively show a perspective view and a plan view of the case where the system of FIG. 2 is applied to an LSI memory card. This LSI memory card places 4 EEPROM chips 1 and one control circuit LSI chip 2 on a card body 3 to transmit and receive signals to and from an exterior via external terminals 4.