Probeable substrate substitute for a calibration standard and test fixture

Abstract

A method and apparatus for a probeable substrate substitute for a calibration standard and test fixture. The probestrate includes a dielectric substrate having first and second dielectric substrate surfaces and at least one conductive via hole through the dielectric substrate from the first dielectric substrate surface to the second dielectric substrate surface. A first metalized layer is in contact with the first dielectric substrate surface and the at least one conductive via hole. A second metalized layer is in contact with a first portion of the second dielectric substrate surface and with the at least one conductive via hole. The first and second test ports contact a second portion of the second dielectric substrate surface. An electronic device can be connected to the first and second test ports with bond wires for characterization via contact of the first and second test ports with standard test station equipment.

Dependencies are inferred from the claim text.