Semiconductor integrated circuit having a built-in test circuit

A semiconductor integrated circuit having a built-in test circuit and comprising:

• a clock driver that converts a single-phase clock pulse inputted from the outside to clock pulses of two phases, one in phase with the inputted clock pulse and the other in reverse phase;
• a test terminal to which is inputted an active signal that directs a test execution;
• a one-shot circuit that generates a high-active output pulse when an active signal is inputted to the test terminal;
• a sequential circuit that is reset in accordance with an output pulse from the one-shot circuit and that outputs a plurality of state value signals on which transitions have been performed according to the output clock pulse of the clock driver;
• a test circuit that is reset in accordance with an output pulse from the one-shot circuit and in which a plurality of levels of latch circuits are serially connected that, in accordance with output of the sequential circuit, successively transmit and hold inputted logic value 1;
• a test register that is reset in accordance with an output pulse from the one-shot circuit, and that, in accordance with the output of the sequential circuit, holds the output value of each of the latch circuits making up the test circuit;
• and
• a data selector that, in accordance with output from the sequential circuit, switches between outputting to an output terminal either the held value of the test register or the operation output of the IC.