Apparatus for measuring the thickness of a moving film utilizing an adjustable numerical aperture lens
AssigneeHewlett-Packard Company
InventorWayne V. Sorin
Life of this patent
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AssigneeHewlett-Packard Company
InventorWayne V. Sorin
Estimating the term…
An apparatus for measuring the thickness of a moving film. The apparatus utilizes a low coherence light source to generate a light signal that is directed at the film with the aid of an optical fiber and lens. A portion of the light reflected from the film is collected and coupled to an interferometer to generate an interference light signal comprising the coherent sum of first and second light signals. The first light signal comprises the collected light signal, and the second light signal comprises the collected light signal offset in time with respect to the first light signal. The offset is varied in time and the interference light signal intensity is measured for the various time offsets. In the preferred embodiment, the numerical aperture of the light focused onto the film may be varied to optimize the light collection for the specific properties of the carriage system used to move the film. The offset is preferably measured by adding a reference light signal with the collected light signal and then detecting the interference pattern generated in the interferometer by the reference light signal.
An apparatus for measuring the thickness of a film, said apparatus comprising:
An apparatus for measuring the thickness of a film, said apparatus comprising:
Dependencies are inferred from the claim text.