US 5,471,482 A · VLSI embedded RAM test

Abstract

A method for comprehensively testing embedded RAM devices and a means for detecting if any of the cells within the embedded RAM devices have a slow write recovery time. The preferred mode of the present invention utilizes built-in self-test (BIST) techniques for testing the embedded RAM's within a VLSI device. In accordance with the present invention, a modified 5N march test sequence is performed on the embedded RAM devices. The modified 5N March test sequence is a simple algorithm implemented in programmable hardware that has the capability of ensuring that the embedded RAM devices are functional and that they meet the recovery time requirements. The preferred mode of the present invention uses this algorithm to determine if the embedded RAMs are operating properly before the VLSI devices are used in card assembly. However, this method can also be used after card assembly to monitor the embedded RAM's integrity.

A method for performing a test of a RAM structure having a plurality of RAM cells, comprising the steps of:

a. writing a first data pattern built from a seed to each RAM cell consecutively between the minimum cell address and the maximum cell address;
b. reading back the data pattern from the minimum cell address of the RAM structure and comparing the result to the data written to that address in step (a) and indicating a fault if the data read does not match the data written;
c. writing a second data pattern built from a compliment of the seed to the minimum cell address of the RAM structure;
d. reading back the data pattern from the minimum cell address of the RAM structure and comparing the result to the data written to that address in step (c) and indicating a fault if the data read does not match the data written;
e. rewriting the second data pattern built from the compliment of the seed to the minimum cell address of the RAM structure;
f. repeating steps (b)-(e) for each address in the RAM structure from the minimum cell address to the maximum cell address;
g. reading back the data pattern from the minimum cell address of the RAM structure and comparing the result to the data written to that address in step (f) and indicating a fault if the data read does not match the data written;
h. writing a data pattern built from the original seed to the minimum cell address of the RAM structure;
i. reading back the data pattern from the minimum cell address of the RAM structure and comparing the result to the data written to that address in step (h) and indicating a fault if the data read does not match the data written;
j. rewriting the data pattern built from the original seed to the minimum cell address of the RAM structure;
k. repeating steps (g)-(j) for each address in the RAM structure from the minimum cell address to the maximum cell address;
l. reading back the data pattern from the maximum cell address of the RAM structure and comparing the result to the data written to that address in step (k) and indicating a fault if the data read does not match the data written;
m. writing a second data pattern built from a compliment of the seed to the maximum cell address of the RAM structure;
n. reading back the data pattern from the maximum cell address of the RAM structure and comparing the result to the data written to that address in step m, and indicating a fault if the data read does not match the data written;
o. rewriting the second data pattern built from the compliment of the seed to the maximum cell address of the RAM structure;
p. repeating steps (l)-(o) for each address in the RAM structure from the maximum cell address to the minimum cell address;
q. reading back the data pattern from the maximum cell address of the RAM structure and comparing the result to the data written to that address in step p, and indicating a fault if the data read does not match the data written;
r. writing a data pattern built from the original seed to the maximum cell address of the RAM structure;
s. reading back the data pattern from the maximum cell address of the RAM structure and comparing the result to the data written to that address in step r, and indicating a fault if the data read does not match the data written;
and
t. rewriting the data pattern built from the original seed to the maximum cell address of the RAM structure;
u. repeating steps (q)-(t) for each address in the RAM structure from the maximum cell address to the minimum cell address.

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VLSI embedded RAM test

Life of this patent

VLSI embedded RAM test

Life of this patent

Abstract

Claims2