Method of and apparatus for measuring optical distortion
AssigneeAsahi Glass Company, Limited
InventorHidehito Tani
Life of this patent
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AssigneeAsahi Glass Company, Limited
InventorHidehito Tani
Estimating the term…
A method of measuring optical distortion of measured material by disposing a background screen (2) having a predetermined regular pattern (3) in rear of a measured material (1) having light transmission properties; disposing an image pick-up device (4) capable of line-scanning in front of the measured material (1); taking a picture of the background screen through the measured material (1) by successively line-scanning the entirety of a range to be measured of the measured material (1) with the image pick-up device (4), and measuring the optical distortion of the measured material (1) on the basis of data in the picture, wherein the regular pattern (3) of the background screen is composed of triangle-wave-like unit patterns (3a), each extending continuously in a predetermined direction, which are arranged at distances of equal pitch.
A method of measuring optical distortion of measured material by disposing a background screen (2) having a predetermined regular pattern (3) in rear of a measured material (1) having light transmission properties;
An apparatus for measuring optical distortion of measured material which comprises:
Dependencies are inferred from the claim text.