Frangible semiconductor wafer dicing method which employs scribing and breaking
OwnerJames W. Loomisinventor
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OwnerJames W. Loomisinventor
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A method for applying a controlled, adjustable strain and strain rate by use of a break wheel to break a frangible semiconductor wafer around previously placed scribe lines formed along a surface of the wafer. Several embodiments of a break wheel are disclosed. One embodiment uses a pair of spaced profiles engageable on opposite sides of a scribe line on the wafer. Another embodiment uses three laterally spaced contact profiles, the center profile having a smaller radius than that of the two flanking contact profiles. Another embodiment uses a complaint break wheel for applying a resilient breaking force to the wafer in a region straddling the scribe line. All embodiments are used with a tilted surface having a break edge with which the scribe line is aligned prior to the application of the breaking force. The tilted surface is adjustable to provide a variable maximum strain limit.
A method of dividing a thin frangible substrate scribed along a scribe line, said method comprising the steps of:
A method of dividing a thin frangible substrate scribed along a scribe line, said method comprising the steps of:
A method of dividing a thin frangible substrate scribed along a scribe line, said method comprising the steps of:
A method of dividing a thin frangible substrate scribed along a scribe line, said method comprising the steps of:
Dependencies are inferred from the claim text.