Magnetometer having periodic winding structure and material property estimator
AssigneeMassachusetts Institute of Technology
InventorsNeil J. Goldfine, James R. Melcher, deceased
Life of this patent
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AssigneeMassachusetts Institute of Technology
InventorsNeil J. Goldfine, James R. Melcher, deceased
Estimating the term…
Apparatus and methods are disclosed which provide increased sensitivity, selectivity and dynamic range for non-contact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application. A measurement apparatus for measuring one or more MUT properties includes an electromagnetic winding structure which, when driven by an electric signal, imposes a magnetic field in the MUT and senses an electromagnetic response. An analyzer is provided for applying the electric signal to the winding structure. A property estimator is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
A magnetometer for measuring one or more properties of a material comprising:
A magnetometer for measuring one or more properties of a material comprising:
A magnetometer for measuring one or more properties of a material comprising:
A magnetometer for measuring an affected zone conductivity and thickness of a processed metal comprising:
A magnetometer for measuring proximity to and conductivity of a material comprising:
A magnetometer for measuring complex permeability of a material comprising:
An apparatus for measuring one or more properties of a material comprising:
A magnetometer for measuring one or more preselected properties of a material having a curved surface comprising:
A magnetometer for measuring one or more properties of a material comprising;
An apparatus for measuring one or more properties of a material comprising:
A magnetometer for measuring proximity to and a second property of a material comprising:
A magnetometer for measuring conductivity and a second property of a material comprising:
Dependencies are inferred from the claim text.