Crosstalk verification device

A crosstalk verification device comprising:

• first providing means for providing layout pattern data specifying a layout pattern to be verified;
• second providing means for providing a design rule on said layout pattern to be verified;
• first storing means for storing a first reference on the size of a transistor prone to exert the influence of crosstalk and a second reference on the size of a transistor susceptible to crosstalk;
• first extracting means connected to said first and second providing means and said first storing means for processing said layout pattern data while referring to said design rule and said first and second references to extract, from said layout pattern data, data on output wiring patterns of a first transistor satisfying said first reference and a second transistor satisfying said second reference out of transistors in said layout pattern to be verified;
• second storing means for storing a third reference on the magnitude of crosstalk noise;
• second extracting means connected to said first extracting means and said second storing means for calculating a wire-to-wire capacitance of an overlap/parallel portion between output wires of said first and second transistors as a function of said data on said output wiring patterns to determine the magnitude of crosstalk noise produced when an output signal of said second transistor rises and falls as a function of said wire-to-wire capacitance, to extract said overlap/parallel portion as an error portion if said magnitude of crosstalk noise exceeds said third reference;
• display means connected to said second extracting means for visually displaying said error portion;
• first file means connected to said first extracting means for accumulating said data on said output wiring patterns extracted by said first extracting means to apply said accumulated data to said second extracting means;
• second file means connected to said second extracting means for accumulating data on said error portion extracted by said second extracting means to apply said accumulated data to said display means;
• wherein, said first extracting means comprises:
• data extracting means connected to said first and second providing means for extracting coordinate data on said transistors in said layout pattern;
• transistor size operating means connected to said data extracting means for calculating transistor sizes of said transistors size in said layout pattern as a function of said coordinate data;
• comparing means connected to said transistor size operating means and said first storing means for comparing each of said transistor sizes with said first and second references to identify said first and second transistors;
• wherein, said second extracting means comprises:
• overlap/parallel portion identifying means connected to said first and second providing means for identifying said overlap/parallel portion between said output wires of said first and second transistors;
• time constant operating means connected to said overlap/parallel portion identifying means and said second providing means for calculating a time constant in said output wire of said first transistor having said overlap/parallel portion with said output wire of said second transistor to extract an overlap/parallel portion of an output wire of a third transistor having a highly probable danger of crosstalk noise occurrence as a function of said time constant in accordance with a predetermined reference;
• wire-to-wire capacitance operating means connected to said time constant operating means and said second providing means for calculating said wire-to-wire capacitance of said. overlap/parallel portion of said output wire extracted by said time constant operating means;
• crosstalk noise operating means connected to said wire-to-wire capacitance operating means for calculating said magnitude of crosstalk noise produced when said output signal of said second transistor rises and falls as a function of said wire-to wire capacitance;
• and
• error portion extracting means connected to said crosstalk noise operating means and said second storing means for extracting said overlap/parallel portion as said error portion if said magnitude of crosstalk noise exceeds said third reference.