Electrodeposited copper foil and process for making same
AssigneeGould Electronics Inc.
InventorsDino F. DiFranco, Shiuh-kao Chiang, Craig J. Hasegawa
Life of this patent
Estimating the term…
Loading patent…
AssigneeGould Electronics Inc.
InventorsDino F. DiFranco, Shiuh-kao Chiang, Craig J. Hasegawa
Estimating the term…
This invention is directed to a controlled low profile electrodeposited copper foil. In one embodiment this foil has a substantially uniform randomly oriented grain structure that is essentially columnar grain free and twin boundary free and has an average grain size of up to about 10 microns. In one embodiment this foil has an ultimate tensile strength measured at 23.degree. C. in the range of about 87,000 to about 120,000 psi and an elongation measured at 180.degree. C. of about 15% to about 28%. The invention is also directed to a process for making the foregoing foil, the process comprising: (A) flowing an electrolyte solution between an anode and a cathode and applying an effective amount of voltage across said anode and said cathode to deposit copper on said cathode; said electrolyte solution comprising copper ions, sulfate ions and at least one organic additive or derivative thereof, the chloride ion concentration of said solution being up to about 1 ppm; the current density being in the range of about 0.1 to about 5 A/cm.sup.2 ; and (B) removing copper foil from said cathode.
A controlled low profile electrodeposited copper foil having a substantially uniform randomly oriented grain structure that is essentially columnar grain free and twin boundary free and has an average grain size of up to about 10 microns.
A controlled low profile electrodeposited copper foil having an ultimate tensile strength measured at 23.degree. C. in the range of about 87,000 to about 120,000 psi and an elongation measured at 180.degree. C. of about 15% to about 28%.
A controlled low profile electrodeposited copper foil having an ultimate tensile strength measured at 23.degree. C. in the range of about 87,000 to about 120,000 psi, an elongation measured at 180.degree. C. of about 15% to about 28%, and a substantially uniform randomly oriented grain structure that is essentially columnar grain free and twin boundary free and has an average grain size of up to about 1 micron.
A process for making electrodeposited copper foil comprising:
A process for making a copper foil comprising:
Dependencies are inferred from the claim text.