Extended linear ion trap frequency standard apparatus
AssigneeThe United States of America as represented by the Administrator of the National Aeronautics and Space Administration
InventorJohn D. Prestage
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AssigneeThe United States of America as represented by the Administrator of the National Aeronautics and Space Administration
InventorJohn D. Prestage
Estimating the term…
A linear ion trap for frequency standard applications is provided with a plurality of trapping rods equally spaced and applied quadrupole rf voltages for radial confinement of atomic ions and biased level pins at each end for axial confinement of the ions. The trapping rods are divided into two linear ion trap regions by a gap in each rod in a common radial plane to provide dc discontinuity, thus dc isolating one region from the other. A first region for ion-loading and preparation/fluorescence is biased with a dc voltage to transport ions into a second region for resonance/frequency comparison with a local oscillator derived frequency while the second region is held at zero voltage. The dc bias voltage of the regions is reversed for transporting the ions back into the first region for fluorescence/measurement. The dual mode cycle is repeated continuously for comparison and feedback control of the local oscillator derived frequency. Only the second region requires magnetic shielding for the resonance function which is sensitive to any ambient magnetic fields.
An extended linear ion trap for frequency standard apparatus, said ion trap having two regions axially aligned for dual mode operation,
Dependencies are inferred from the claim text.