Grating fabrication using electron beam lithography
AssigneeAmerican Telephone and Telegraph Company
InventorsThomas L. Koch, Frederick W. Ostermayer, Jr., Donald M. Tennant, Jean-Marc Verdiell
Life of this patent
Estimating the term…
Loading patent…
AssigneeAmerican Telephone and Telegraph Company
InventorsThomas L. Koch, Frederick W. Ostermayer, Jr., Donald M. Tennant, Jean-Marc Verdiell
Estimating the term…
A technique is disclosed for utilizing direct-write electron-beam photolithography and holographic optical exposure to form gratings in optoelectronic structures. The direct-write e-beam process is used to form rectangular grating teeth in a mask substrate, where the mask is then used as a phase mask to transfer the pattern to the optoelectronic device. Advantageously, the utilization of a direct write e-beam technique to form the grating pattern on the photomask allows for the formation of any desired number and location of abrupt phase shifts, multiple grating pitches, alignment fiducials, and any other desired features. Therefore, a single exposure of the direct write e-beam mask allows for a plurality of different grating patterns to be simultaneously printed.
A method of fabricating predetermined grating structures in optoelectronic devices, the method comprising the steps of:
A method of forming a direct write e-beam photomask, the method comprising the steps of:
Dependencies are inferred from the claim text.