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US 5,402,062 AGranted
Mechanical capture of count wafer for particle analysis
AssigneeAbbott Laboratories
InventorsThomas L. Barnes, James W. Colburn, Catherine L. Danial, Sangvorn Rutnarak
Life of this patent
Estimating the term…
Abstract
A particle count probe comprises a wafer having an aperture. A first member is provided having a fluid passageway. A second member is removably mounted to the first member, and cooperates with the first member and the wafer to position the wafer so that the aperture of the wafer aligns with the fluid passageway.
Claims10
A particle analyzer having a count probe capable of counting particles comprising:
- (a) a tube member having a connection end and two fluid passageways therein;
- (b) a removable cap having an interior mounted to the connection end of the tube, wherein the interior of the cap provides a connection between the two fluid passageways of the tube member to form one continuous passageway, said cap having a bore extending through a side wall thereof;
- and
- (c) a count wafer having an aperture dimensioned to fit in the bore formed in the side wall of the cap, wherein the wafer is held in the bore by forces exerted by the cap, the aperture of the wafer being positioned to align with the continuous passageway formed by the cap and tube.
1 more element
A particle analyzer having a count probe for counting particles comprising:
- (a) a core member having a fluid passageway formed therein and a recess formed on one side so as to expose a portion of the fluid passageway;
- (b) a wafer having an aperture dimensioned to fit within the recess of the core member so that the aperture exposes a portion of the fluid passageway;
- and
- (c) a sleeve member removably mounted over the core member and the wafer mounted therein to hold the wafer in place, the sleeve member having an aperture in one side which, when the sleeve member is mounted over the core member and the wafer, aligns with the aperture in the wafer.
1 more element
A count probe comprising:
- (a) a member having a conduit and an opening;
- (b) a wafer including an aperture, wherein the wafer is dimensioned with respect to the opening such that the wafer is removably retained within the opening by an interference fit between the wafer and the member.
Dependencies are inferred from the claim text.